Titan Tool Supply, Inc. announced the introduction of its new model ZDM-3 vertical displacement microscope to measure minute variations in height. The Z-Axis electronic depth measuring microscope features a built-in LED co-axial illuminator to allow the user to focus on the top or bottom of the part being inspected. The illuminator includes a green filter and is adjustable to control light, color, and intensity.
Applications in the electronics industry include the semiconductor field to measure heights of the bonded portion of lead wire, wafer bump, lead frames, and solder. The new microscope also measures the step heights of hybrid integrated circuits as well as terminal steps on multi-layer PC boards. Other applications include measuring the depth of minute cracks, engraving depth of printing rolls and plastic molds, depth grooves of computer media, and the depth of score on beverage cans, according to Titan Tool.